Researchers from Osaka University report a nondestructive method for identifying threading dislocations in GaN substrates that could help to improve quality and improve yields
Title Image SP:
<plone.namedfile.file.NamedBlobImage object at 0x7fed78b70eb0 oid 0x260505 in <Connection at 7fee46841610>>
Announcement Date
2021-04-28
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engineering
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{'items': [{'key': 'd584d', 'term': '', 'description': {'blocks': [{'key': '2kcal', 'text': '', 'type': 'unstyled', 'depth': 0, 'inlineStyleRanges': [], 'entityRanges': [], 'data': {}}], 'entityMap': {}}}]}
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['eng']
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['Mayuko Tsukakoshi', 'Tomoyuki Tanikawa']
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